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Resistance Measuring Instrument(co) - List of Manufacturers, Suppliers, Companies and Products

Resistance Measuring Instrument Product List

1～6 item / All 6 items

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Measuring device Main circuit resistance tester ST102

Measuring device Main circuit resistance tester ST102

Easy to handle with fewer operating parts.

This is a device for measuring the contact resistance of the main contact part of electrical switching devices, consisting of a current generator and a digital voltmeter. There is no dedicated demo unit for the ST-102A, but you can try the operation feel with the ST-10A (10A type) demo unit. Customers who want to "try the operation feel," "check if the settings can be easily made," or "confirm if the intended tests can be conducted" are requested to submit a request for a "demo unit" through the standard product inquiry form on our website. https://serizawa-sr.co.jp/contact-1

  • Other measurement, recording and measuring instruments

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Measuring instrument Main circuit resistance tester

Measuring instrument Main circuit resistance tester

For maintenance and inspection of the main circuit! Used by about 50 companies nationwide (such as power plants, substations, heavy electrical manufacturers, etc.)! Direct reading of resistance value, high precision, durable, and inexpensive!

This is a device for measuring the contact resistance of the main contact part of electrical switching devices, consisting of a current generator and a digital voltmeter. *Since 2022, a new type of case has been introduced. The appearance is slightly different from the conventional case. Please refer to the photos and dimensions in the catalog. Customers who would like to "try the operation feel," "check if the settings can be easily made," or "confirm if the intended tests can be conducted" are requested to submit a "Demo machine request" through the standard product inquiry form on our website. https://serizawa-sr.co.jp/contact-1

  • Voltage Meter

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Non-contact sheet resistance measurement device 'DELCOM'

Non-contact sheet resistance measurement device 'DELCOM'

Achieving high-precision measurements over a wide measurement range without causing physical damage to the sample!

"DELCOM" is a non-contact sheet resistance measurement system using the DC eddy current method. It is used in research and development, inspection processes, and manufacturing lines for semiconductor/LCD substrates, solar cell cells, flexible materials, and various conductive films, achieving high-precision measurements over a wide measurement range without causing physical damage to the samples. The measurement applications include semiconductors, ITO films, graphene & carbon, capacitive metal wheels, and electromagnetic wave absorbing materials. 【Features】 ■ Non-contact sheet resistance measurement system using the DC eddy current method ■ Does not cause physical damage to samples in research and development, inspection processes, and manufacturing lines ■ Achieves high-precision measurements over a wide measurement range ■ The measurement range can be selected from four ranges according to the resistance range *For more details, please refer to the PDF document or feel free to contact us.

  • Insulation Tester

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Main Circuit Resistance Tester

Main Circuit Resistance Tester

Main circuit resistance tester

This is a device for measuring the contact resistance of the main contact part of a power circuit breaker. (1) Connect this product to the main circuit using the included cable, (2) turn the power switch ON, and (3) simply adjust to the desired current. It is portable, making it suitable for on-site work. ● The current can be varied up to a maximum of 100A (adjustable range: 50-105A). ● It can measure resistance up to a maximum of 1.999 mΩ. ● Open circuit voltage: DC 5V. ● Three display modes: resistance, current, voltage. ● Latest model of the ST series. There is no dedicated demo unit for the ST-102A, but you can try the operation feel with the ST-10A (10A type) demo unit. Demo units are available! We offer demo unit rentals for customers considering purchase. If you would like to "try the operation feel," "check if the settings can be easily made," or "confirm if the intended tests can be conducted," please request "demo unit desired" through the standard product inquiry form on our website. https://serizawa-sr.co.jp/contact-1

  • Electrical Instruments/Electrometers
  • Other measurement, recording and measuring instruments
  • Voltage Meter

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Contact Resistance Tester "DUORES"

Contact Resistance Tester "DUORES"

Handheld sheet resistance meter!

"DUORES" is a handy type sheet resistance measuring device that is easy to carry and easy to use for measurements. It features two types of probes (non-destructive and contact) that can be exchanged according to the measurement target. Simply place or touch the probe, and it will automatically measure. It can be customized in various ways according to customer requests. Additionally, it is available for purchase as just the main unit with the non-destructive probe or just the main unit with the contact probe. [Features] ■ Contact type ■ Exchangeable 2 probes ■ Handy type *For more details, please contact us or download the catalog.

  • Semiconductors and ICs
  • Other measurement and measuring equipment

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Non-contact sheet resistance measurement device "LEI-1510 Series"

Non-contact sheet resistance measurement device "LEI-1510 Series"

Excellent measurement linearity over a wide range! Can be verified on a PC monitor as a three-dimensional graphic map.

The "LEI-1510 series" is a non-contact sheet resistance measurement device manufactured by the former Reihiton company. By attaching a robot, it is possible to quickly measure and process multiple samples. It solves the reproducibility issues caused by probe contact contamination and the contact condition that occur with the four-probe method. It measures sheet resistance non-contact and destructively for Si wafers ranging from 2 inches to a maximum of 8 inches, as well as compound semiconductor (GaAs, GaN, InP, etc.) epi wafers. 【Features】 - Solves reproducibility issues caused by probe contact contamination and contact conditions - Capable of quickly measuring and processing multiple samples - Excellent measurement linearity over a wide range of 0.035 to 3200 ohm/sq. - Measurement data can be viewed as a three-dimensional graphic map on a PC monitor *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Semiconductor inspection/test equipment

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